<?xml version="1.0" encoding="ISO-8859-1"?><article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance">
<front>
<journal-meta>
<journal-id>0212-9728</journal-id>
<journal-title><![CDATA[Anales de Psicología]]></journal-title>
<abbrev-journal-title><![CDATA[Anal. Psicol.]]></abbrev-journal-title>
<issn>0212-9728</issn>
<publisher>
<publisher-name><![CDATA[Universidad de Murcia]]></publisher-name>
</publisher>
</journal-meta>
<article-meta>
<article-id>S0212-97282022000300013</article-id>
<article-id pub-id-type="doi">10.6018/analesps.509551</article-id>
<title-group>
<article-title xml:lang="en"><![CDATA[Validation of the spanish version of the Technostress Creators Scale in chilean workers]]></article-title>
<article-title xml:lang="es"><![CDATA[Validación de la versión en español del Inventario de Creadores de Tecnoestrés en trabajadores chilenos]]></article-title>
</title-group>
<contrib-group>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Salazar-Concha]]></surname>
<given-names><![CDATA[Cristian]]></given-names>
</name>
<xref ref-type="aff" rid="Aff"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Ficapal-Cusí]]></surname>
<given-names><![CDATA[Pilar]]></given-names>
</name>
<xref ref-type="aff" rid="Aff"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Peñarroja]]></surname>
<given-names><![CDATA[Vicente]]></given-names>
</name>
<xref ref-type="aff" rid="Aff"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Enache-Zegheru]]></surname>
<given-names><![CDATA[Mihaela]]></given-names>
</name>
<xref ref-type="aff" rid="Aff"/>
</contrib>
</contrib-group>
<aff id="Af1">
<institution><![CDATA[,Universidad Austral de Chile Faculty of Economic and Administrative Sciences ]]></institution>
<addr-line><![CDATA[Valdivia ]]></addr-line>
<country>Chile</country>
</aff>
<aff id="Af2">
<institution><![CDATA[,Universitat Oberta de Catalunya Faculty of Economics and Business Studies and Interdisciplinary Research Group on ICT ]]></institution>
<addr-line><![CDATA[Barcelona ]]></addr-line>
<country>Spain</country>
</aff>
<pub-date pub-type="pub">
<day>00</day>
<month>12</month>
<year>2022</year>
</pub-date>
<pub-date pub-type="epub">
<day>00</day>
<month>12</month>
<year>2022</year>
</pub-date>
<volume>38</volume>
<numero>3</numero>
<fpage>518</fpage>
<lpage>529</lpage>
<copyright-statement/>
<copyright-year/>
<self-uri xlink:href="http://scielo.isciii.es/scielo.php?script=sci_arttext&amp;pid=S0212-97282022000300013&amp;lng=en&amp;nrm=iso"></self-uri><self-uri xlink:href="http://scielo.isciii.es/scielo.php?script=sci_abstract&amp;pid=S0212-97282022000300013&amp;lng=en&amp;nrm=iso"></self-uri><self-uri xlink:href="http://scielo.isciii.es/scielo.php?script=sci_pdf&amp;pid=S0212-97282022000300013&amp;lng=en&amp;nrm=iso"></self-uri><abstract abstract-type="short" xml:lang="en"><p><![CDATA[Abstract The purpose of this study was to adapt and validate the Spanish version of the Technostress Creators Scale (TCS). The scale was administered to 1.047 Chilean professionals. The internal structure of the scale was tested by conducting exploratory and confirmatory factor analyses. The average variance extracted (AVE) and the Fornell-Larcker criterion were used to examine convergent and discriminant validity, respectively. To investigate concurrent validity, we focused on the relation between the TCS scale and role stress, which is a distinct, albeit conceptually related construct. Our findings supported a five-factor model consisting of 23 items distributed in five factors: techno-overload, techno-invasion, techno-complexity, techno-insecurity and techno-uncertainty. The Spanish version of the TCS had a high level of internal consistency, which was similar to the original scale. Appropriate evidence of concurrent validity was also shown. In addition, we conducted an international comparison of the research results with other relevant adaptations of the instrument reported in different cultural contexts. The results confirmed that the Spanish translation of the TCS is a suitable instrument for measuring technostress and can contribute to an empirical examination of this phenomenon in Spanish-speaking countries.]]></p></abstract>
<abstract abstract-type="short" xml:lang="es"><p><![CDATA[Resumen El propósito de esta investigación fue adaptar y validar al español el Inventario de Creadores de Tecnoestrés (ICT). La escala fue administrada a 1.047 trabajadores chilenos. Para analizar la estructura interna de la escala, se aplicaron análisis factoriales exploratorios y confirmatorios. La varianza media extraída (AVE) y el criterio de Fornell-Larcker fueron utilizados para examinar la validez convergente y discriminante, respectivamente. Para valorar la validez concurrente, se ha analizado la relación entre la escala ICT y el estrés del rol, que es un constructo distinto, aunque conceptualmente relacionado. Nuestros resultados respaldaron un modelo que consta de 23 elementos distribuidos en cinco factores: tecno-sobrecarga, tecno-invasión, tecno-complejidad, tecno-inseguridad y tecno-incertidumbre. La versión en español del instrumento ofrece un alto nivel de consistencia interna, que es similar a la escala original. También se obtuvieron evidencias de validez concurrente. Además, se ha realizado una comparación internacional de los resultados de la investigación con otras adaptaciones relevantes del instrumento reportadas en diferentes contextos culturales. Los resultados confirmaron que la traducción al español del ICT es un instrumento adecuado para medir el tecnoestrés y puede contribuir a un examen empírico de este fenómeno en los países de habla hispana.]]></p></abstract>
<kwd-group>
<kwd lng="en"><![CDATA[Technostress]]></kwd>
<kwd lng="en"><![CDATA[Technostress creators]]></kwd>
<kwd lng="en"><![CDATA[Scale validation]]></kwd>
<kwd lng="en"><![CDATA[Exploratory factor analysis]]></kwd>
<kwd lng="en"><![CDATA[Confirmatory factor analysis]]></kwd>
<kwd lng="es"><![CDATA[Tecnoestrés]]></kwd>
<kwd lng="es"><![CDATA[Creadores de Tecnoestrés]]></kwd>
<kwd lng="es"><![CDATA[Validación de escalas]]></kwd>
<kwd lng="es"><![CDATA[Análisis factorial exploratorio]]></kwd>
<kwd lng="es"><![CDATA[Análisis factorial confirmatorio]]></kwd>
</kwd-group>
</article-meta>
</front><back>
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